EE-332 Devices and Circuits 2 Laboratory Handbook -
Revision 4, Autumn 2014
The Table of Contents for the EE-332 Devices and Circuits
2 Laboratory Handbook is shown below. Each of the eight chapters can be downloaded as a pdf document from this website,
if desired. These links are at the bottom of this page.
Only a subset of the listed procedures are typically assigned for each
experiment. It is a good idea to list the procedures that the students are
to perform well in advance of the laboratory session.
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Contents |
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| I. |
Organization, Hardware and Policies |
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1. Introduction
2. Calendar for the Quarter
3. Location and Time Slots
4. Laboratory Groups
5. Laboratory Grading
6. Electronic Instrumentation
7. Parts Kits
8. Replacement Parts
9. Laboratory Notebooks
10. How to Use the Experimental Procedures
11. Errata and Improvements |
4
5
6
6
7
8
14
16
16
17
18 |
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| II. |
The Experiments |
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| 0. |
Data Acquisition Using LabVIEW |
(E0) |
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P1. Temperature measurement using LabVIEW and a DAQ card
P2. Adding a Celsius to Fahrenheit conversion
P3. Saving measurement results to spreadsheet files
P4. Measurement of diode I-V characteristic curves |
E0.2
E0.7
E0.9
E0.11 |
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| 1. |
Bipolar Junction Transistor
Characterization |
(E1) |
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P1. BJT base lead and sex identification
P2. Measurement of a BJT using a LabVIEW curve tracer
P3. Dependence of BF on collector current level
P4. Measurement of BJT reverse characteristics
P5. Measurement of BJT turn-on voltage and ideality factor
P6. Measurement of BJT output conductance
P7. Temperature effects
P8. Measurement of a pnp BJT
P9. Measurement of a power BJT
P10. Measurement of an array BJT |
E1.2
E1.4
E1.9
E1.11
E1.13
E1.15
E1.17
E1.18
E1.18
E1.18 |
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| 2. |
Single-Stage BJT Amplifiers |
(E2) |
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P1. NPN common-emitter stage characteristics
P2. PNP complement to the common-emitter stage
P3. Biasing up an npn stage
P4. Common-emitter amplifier
P5. Common-emitter amplifier with bypassed emitter resistor
P6. Common-collector amplifier (emitter-follower)
P7. Common-base amplifier |
E2.2
E2.5
E2.8
E2.11
E2.14
E2.16
E2.18 |
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| 3. |
Multi-Transistor Configurations |
(E3) |
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P1. Current mirror
P2. Widlar current sources
P3. Wilson current sources
P4. Emitter-coupled pair
P5. Differential amplifier |
E3.2
E3.4
E3.7
E3.9
E3.11 |
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| 4. |
Multi-Stage Amplifiers |
(E4) |
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P1. Wideband CE-EF amplifier
P2. CE-CB cascode with EF buffer
P3. High-gain cascode
P4. Active loads---a simple opamp |
E4.3
E4.5
E4.7
E4.9 |
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| 5. |
Feedback Circuits and Other
Applications |
(E5) |
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P1. Series-pass zener diode positive voltage regulator
P2. Series-pass positive voltage feedback regulator
P3. Opamp positive voltage regulator
P4. Complementary class-AB output stage |
E5.2
E5.4
E5.7
E5.9 |
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| III. |
The Design Project: |
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Information and Guidelines |
(D1) |
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1. Overview of Electronic Circuit Design
2. Design Project Guidelines
3. Design Project Documentation |
D1.1
D1.3
D1.4 |
Download the EE-331 Laboratory Handbook:
I. Organization, Hardware, and Policies
(189 kB pdf)
II. The Experiments:
0. Experiment-0: Data
Acquisition Using LabVIEW (710 kB pdf)
1. Experiment-1: Bipolar
Junction Transistor Characterization (356 kB pdf)
2. Experiment-2: Single-Stage BJT Amplifiers (160 kB pdf)
3. Experiment-3: Multi-Transistor Configurations (152 kB pdf)
4. Experiment-4:
Multi-Stage Amplifiers (194 kB pdf)
5. Experiment-5: Feedback
Circuits and Other Applications (177 kB pdf)
III. The Design Project Information and
Guidelines (102 kB pdf)
Packaged set of EE-332 LabVIEW 2013 VIs for the experiments
(348 kB zip) for use with National Instruments NI-USB-6009 DAQ
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